FPOR20110 is automatic material test system for Dk/Df measurement. The frequency range could be support from 20 GHz to 120 Ghz. It could provide accurate and stable material parameters to materials development engineers and circuit design engineers. RF substrate material parameters and the roughness between the substrate and the copper foil are critical for circuit design engineers to use analog software to design circuits. It is the first testing system that can measure Dk/Df of materials as well as surface roughness. FPRO20110 can support DUT thickness ranging from 10um to 1mm.
Millimeter wave material measurement systems can provide valuable information for the development and characterization of new material in various industries. There systems user electromagnetic waves in the millimeter wavelength range to probe the physical properties of materials such as their dielectric constant, loss tangent, conductivity and thickness.
By measuring these properties the millimeter wave material measurement system can help manufactures optimize the performance and reliability of their products, such a printed circuit boards (PCBs), flexible boards, ceramic substrates and packaging materials.
The transmission loss included dielectric loss and conductor loss. Conducting loss dominated by the interface of substrate and metal. The hemispherical Fabry Perot Open Resonator (FPOR) with a reflective structure of signal is good tools for measurement dielectric properties and metal loss.
Cavity Q Improved
Frequency Ragne Support
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FPOR2040 : 20 GHz to 40 GHz
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FPOR2060 : 20 GHz to 67 GHz
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FPOR20110 : 20 GHz to 110 GHz
Low Dk Material Measurement
- Dk Ragne : 1 to 30
- DUT Dimetnsion : 6cm x 6cm or large
Frequency Section Design
- FPOR2040 : t: 2mm to 5um
- FPOR2060 : t: 1mm to 5um
- FPOR20110 : t: 0.5mm to 5um
Motio Information
- Minimun incremental motion : 25nm
- Bi-directional Repeatability : 120nm
- Movement Range : 32mm
